Silicon Probes(AFM 探針)

Both cantilever & tip are Si(AFM 探針)

SILICON NITRIDE PROBES(AFM 探針)

SiN cantilever with Si or SiN tip(AFM 探針)

ACCESS Tip-View Probes(AFM 探針)

Allows direct view of the tip as it images the sample(AFM 探針)

Conductive Probes(AFM 探針)

Conductive probes for EFM, MFM(AFM 探針)

QUANTITATIVE FORCE SPECTROSCOPY(AFM 探針)

Quantitative force spectroscopy(AFM 探針)

High Aspect Ratio Tip (HART)(AFM 探針)

Deep trench metrology(AFM 探針)

STM Products(AFM 探針)

AppNano also offers high quality STM probes and STM tip etcher.(AFM 探針)

SICONGG(AFM 探針)

此款有10支裝、20支裝、50支裝、200支裝、410支-424支裝(wafer)(AFM 探針)

SHOCONGG導電探針(AFM 探針)

SHOCONGG導電探針(AFM 探針)

NITRA-TALL-R-G(AFM 探針)

常用包裝數量10支裝、20支裝、50支裝(AFM 探針)

ACCESS-NC-GG(AFM 探針)

AppNano ACCESS?-NC-GG probes are sharp silicon probes for tapping / non-contact mode applications that allow a direct optical view of the AFM tip and designed for applications that require seeing the tip as it engages the surface. These probes are nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging. Reflex and tip sides are coated with gold.(AFM 探針)

HYDRA6V-200W/200WG(AFM 探針)

共振頻率17kHz;彈性系數0.081n/m;曲率半徑6nm(AFM 探針)