Silicon Probes(AFM 探針)

  • Contact mode
  • Force modulation
  • Tapping™/Non-contact


SILICON PROBES

  • AppNano silicon probes are manufactured out of prime grade, low resistivity (0.01- 0.025 Ω-cm), n-type antimony doped, single crystal silicon
  • Our well-established silicon technologies combined with novel micro-fabrication processes achieve consistent high quality monolithic probes with unprecedented tip sharpness
  • We have many standard silicon probe series designed for a wide variety of applications that are compatible with most AFM equipment in the market

Tapping mode AFM probes TAPPING MODE PROBES

ACL Series:

  • Designed for Tapping™/Non-contact mode applications
  •  
  • Features long, thick and wide cantilever for greater laser clearance
  • Available with different tip and cantilever options for different applications
ACL- Long Tapping mode AFM probe
Cantilever Specs. *
k (N/m) 58
f (kHz) 190
Length (μm) 225
Width (μm) 40
Thickness (µm) 7.8
Coating (reflex side)
  • Al
  • Au
  • None
Tip specs. *
Material Silicon
ROC (nm) 6
Height (μm) 14-16
Shape Tetrahedral
Options
  • Au coating (GG) (GG)
  • Super Sharp (SS)
  • Tipless (TL)
  • None

ACST Series:

  • Designed for soft Tapping™/Non-contact mode applications
  •  
  • Features reasonably soft and mid-range resonance frequency cantilever
  • Available with different tip and cantilever options for different applications
ACST- Soft Tapping Mode AFM Probe
Cantilever Specs. *
k (N/m) 7.8
f (kHz) 150
Length (μm) 150
Width (μm) 28
Thickness (µm) 3
Coating (reflex side)
  • Al
  • Au
  • None
Tip specs. *
Material Silicon
ROC (nm) 6
Height (μm) 14-16
Shape Tetrahedral
Options
  • Uncoated
  • Au coating (GG)
  • Super Sharp (SS)
  • Tipless (TL)

ACT series:

  • Short and stiff cantilever with high resonance frequency for high speed scanning of hard samples in Tapping™/Non-contact modes
  • Available with different tip and cantilever options for variety of applications
ACT- Hard Tapping mode AFM probe
Cantilever Specs. *
k (N/m) 37
f (kHz) 300
Length (μm) 125
Width (μm) 30
Thickness (µm) 4
Coating (reflex side)
  • Al
  • Au
  • None
Tip specs. *
Material Silicon
ROC (nm) 6
Height (μm) 14-16
Shape Tetrahedral
Options
  • Au coating (GG)
  • Ball tip
  • Doped Diamond
  • Plateau (PTU)
  • Super Sharp (SS)
  • Tipless (TL)
  • None

Force Modulation AFM Probes FORCE MODULATION PROBES

FORT series:

  • Features medium spring constant and frequency cantilevers for force modulation mode
  • FORT probes are specially designed for this mode
  • A variety of tip and cantilever options available for different microscopy applications
FORT AFM Probes
Cantilever Specs. *
k (N/m) 1.6
f (kHz) 61
Length (μm) 225
Width (μm) 27
Thickness (µm) 2.7
Coating (reflex side)
  • Al
  • Au
  • None
Tip specs. *
Material Silicon
ROC (nm) 6
Height (μm) 14-16
Shape Tetrahedral
Options
  • Au coating (GG)
  • Ball tip
  • Doped Diamond
  • Plateau (PTU)
  • Super Sharp (SS)
  • Tipless (TL)
  • None

Contact Mode AFM Probes CONTACT MODE PROBES

SHOCON series:

  • Soft and short (high sensitivity) cantilever for contact mode applications
  • Available with different tip and cantilever options for imaging in air or liquid media
SHOCON- Short Contact Mode AFM Probe
Cantilever Specs. *
k (N/m) 0.14
f (kHz) 21
Length (μm) 225
Width (μm) 46
Thickness (µm) 1
Coating (reflex side)
  • Al
  • Au
  • None
Tip specs. *
Material Silicon
ROC (nm) 6
Height (μm) 14-16
Shape Tetrahedral
Options
  • Au coating (GG)
  • Super Sharp (SS)
  • Tipless (TL)
  • None
 
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