ACCESS Tip-View Probes(AFM 探針)

  • Contact mode
  • Force modulation
  • Tapping™/Non-contact
  • Conductive- PtIr
  • Conductive- Gold
  • Conductive- DD



ACCESS (TIP VIEW) PROBES

  • Sharp silicon probes that allow a direct visualization of the AFM tip as it engages the sample surface
  • Nanofabricated using highly doped single crystal silicon with unparalleled reproducibility, robustness and sharpness for consistent high resolution imaging
  • Several variations to suit different modes of AFM and special applications like EFM
  • Uncoated/gold coated (reflex side) probes are suitable for applications in air/liquid
  • Uncoated/aluminum coated (reflex side) probes are suitable for applications in air
  • Both sides gold coated (GG) probes are recommended for functionalization/non-contact electric force microscopy studies like Electrostatic Force Microscopy/KPFM etc.
  • Platinum-Iridium (Pt-Ir) coated probes are recommended for contact EFM as well as PFM, KPFM etc.,
  • Doped Diamond (DD) probes are ideal choice for Contact as well as Tapping™ electrical force microscopy applications like SSRM, PFM, EFM, KPFM etc.

ACCESS-C:

  • Suitable for Contact mode applications
Cantilever Specs. *
k (N/m) 0.3
f (kHz) 16
Length (μm) 450
Width (μm) 49
Thickness (μm) 2.5
Coating (reflex side) None/Al
Special option Au
Tip specs. *
ROC (nm) <10
Height (μm) 14-16
Shape Triangular
Coating Uncoated
ACCESS-C Tipview contact mode probe

ACCESS-FM:

  • Optimized for Force modulation mode imaging applications
Cantilever Specs. *
k (N/m) 2.7
f (kHz) 60
Length (μm) 245
Width (μm) 52
Thickness (μm) 2.8
Coating (reflex side) None/Al
Special option Au (reflex side)
Tip specs. *
ROC (nm) <10
Height (μm) 14-16
Shape Triangular
Coating Uncoated
Special option Au coating(GG)
ACCESS-NC Tipview Tapping/Noncontact mode probe

ACCESS-NC:

  • Is designed for Tapping™/Non-contact mode applications
Cantilever Specs. *
k (N/m) 113
f (kHz) 330
Length (μm) 150
Width (μm) 54
Thickness (μm) 5.5
Coating (reflex side) Al, None
Special option Au (reflex side)
Tip specs. *
ROC (nm) <10
Height (μm) 14-16
Shape Triangular
Coating Uncoated
Special option Au coating (GG)
ACCESS-FM Tipview Force Modulation mode Probe

ACCESS-EFM:

  • Series of probes coated with platinum-iridium (Pt-Ir) on different cantilevers for contact, force modulation and Tapping™/Non-contact mode EFM applications.
Cantilever Specs. *
k (N/m) 2.7
f (kHz) 60
Length (μm) 245
Width (μm) 52
Thickness (µm) 2.8
Coating Pt-Ir
Tip specs. *
ROC (nm) <10
Height (μm) 14-16
Shape Triangular
Coating Pt-Ir
ACCESS-EFM PtIr coated Tipview EFM probe

ACCESS-FM-GG:

  • Gold coated probes with excellent conductivity and chemical stability, designed for non-contact electrical studies like EFM, KPFM etc.
Cantilever Specs. *
k (N/m) 2.7
f (kHz) 60
Length (μm) 245
Width (μm) 52
Thickness (µm) 2.8
Coating Au
Tip specs. *
ROC (nm) 30
Height (μm) 14-16
Shape Triangular
Coating Au
ACCESS-FM-GG Gold coated Tipview EFM probe

ACCESS-NC-GG:

  • Gold coated probe on Tapping/Non-contact mode cantilever for non-contact electrical studies like EFM, KPFM etc.
Cantilever Specs. *
k (N/m) 113
f (kHz) 330
Length (μm) 150
Width (μm) 54
Thickness (µm) 5.5
Coating Au
Tip specs. *
ROC (nm) 30
Height (μm) 14-16
Shape Triangular
Coating Au

 

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