Co-Cr coated 磁性鍍膜探針(AFM 探針)

Typical radius of uncoated tip : 8 nm
Resulting tip radius with the coating : < 60 nm
Full tip cone angle* : 40°
Total tip height : 12 - 18 µm
Probe material : n-type silicon
Tip coating : Magnetic
Detector coating : Aluminum

The coating consists of a Co layer on the tipside of the cantilever. The Co layer is formed as a polycrystalline film, which allows steady permanent magnetization in the direction of the tip axis. The Co coating is protected from oxidation by a thin Cr layer, resulting in longer cantilever performance. Typical coercivity Hc of the Co-Cr coating ranges from 300 to 400 Oe.

All chips are pre-magnetized at the facility before shipping to end users. In some cases additional magnetization by an arbitrary strong magnet is required, e.g. SmCo or NdFeB.

APPLICATION

Cantilevers with magnetic Co-Cr coating should be used for MFM research. Mapping of magnetic forces to topography AFM scans can be used to characterize the domain structure of the magnetic materials.

The Co-Cr coating on most MFM probes creates a magnetic moment of about 10-13 emu. Imaging in external magnetic field is a way to enhance the sensitivity further as it may increase the moment of both the MFM tip and the sample. Note that the magnetic structure of some samples having low coercivity (permalloy, garnet films, etc.) may be significantly affected by the magnetized Co-Cr coated probe.


1-CANTILEVER SERIES

Cantilever Resonance Frequency, kHz Force Constant, N/m
min typical max min typical max
18 series 60 75 90 1.2 2.8 5.5

 

3-CANTILEVERS SERIES

Cantilever Resonance Frequency, kHz Force Constant, N/m
min typical max min typical max
36 series Cantilever A 30 60 160 0.1 1.0 4.6
Cantilever B 45 130 240 0.2 2 9
Cantilever C 25 65 115 0.06 0.6 2.7
說明 檔案大小 下載
mikromasch 探針型錄 123KB
型號 概述 詢價數量