APEX SHARP(AFM 探針)

鋒利的導電鉆石探針

高導電性 Super Sharp 和 Apex Sharp 金剛石探針由獨特的專利工藝制成,可確保最佳的納米機械和電氣性能。這些尖端比任何其他電子 AFM 探頭更鋒利,使用壽命更長。導電金剛石涂層高度摻雜硼,導致宏觀電阻率為 0.003 - 0.005 Ohm?cm。接觸電阻通常為 10 kΩ,具體取決于在銀表面上測量的接觸半徑。通過使用耐磨的鋒利金剛石探頭,接觸尺寸得到了很好的表征,并在機械測量過程中保持不變。這些探頭已經證明了連續使用超過 24 小時的定量和可重復測量。在懸臂的檢測器側沉積金反射涂層以提高反射率。

成像模式:接觸模式、敲擊模式、調幅、調頻、真正的非接觸模式、LFM、納米操作等。

電氣模式:C-AFM、SCM、PFM、EFM、KPFM、PeakForce-KPFM™、TUNA、PeakForce-TUNA™、SSRM、STM、光刻、SRM、ResiScope™、Soft-ResiScope™、HD-KFM™等。

納米力學模式:PeakForce-QNM™、AMFM 模式、接觸共振、QI™ 模式、PinPoint™ 納米力學模式、HybriD 模式™、納米壓痕

 


 

APEX SHARP

Highly conductive Apex Sharp diamond probes, formed by a unique patented process ensure the best possible nanomechanical and electrical performance. Quantitative and repeatable measurements for over 24 hours of continuous use have been demonstrated with these probes. By using wear-resistant sharp diamond probes the tip-sample contact size is well characterized and stays constant during mechanical and electrical measurements leading to more reliable data.

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  • Highly doped with boron with a macroscopic resistivity of 0.003 - 0.005 Ohm?cm.
  • Typical contact resistance of 10 k? depending on contact radius (measured on a silver surface).

  • Gold reflex coating on the detector side of the cantilever to enhance reflectivity.

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Minimum quantity: 5.

Volume discounts:
20-pack = 5 % 50-pack = 10 % 100-pack = 20 % 200-pack = 30 %

Probes are always shipped as 5 probes per box.

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