SUPER SHARP(AFM 探針)

Super Sharp 鉆石探針能夠直接開箱即用地進行原子分辨率的地形和電子成像。 這些尖端提供了市場上最高的電氣分辨率。 通過使用耐磨的鋒利鉆石探針,可以很好地表征尖端-樣品接觸尺寸,并在機械和電氣測量期間保持恒定,從而獲得更可靠的數據。


SUPER SHARP

Super Sharp diamond probes are capable of atomic resolution topographical and electrical imaging straight out of the box. These tips offer the highest electrical resolution on the market. By using wear-resistant sharp diamond probes the tip-sample contact size is well characterized and stays constant during mechanical and electrical measurements leading to more reliable data.

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  • Highly doped with boron with a macroscopic resistivity of 0.003 - 0.005 Ohm?cm.

  • Typical contact resistance of 10 k? depending on contact radius (measured on a silver surface).

  • Gold reflex coating on the detector side of the cantilever to enhance reflectivity.

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Minimum quantity: 5.

Volume discounts:
20-pack = 5 % 50-pack = 10 %

Probes are always shipped as 5 probes per box.

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