ElectriCont-G(AFM 探針)

Application

  • scanning capacitance microscopy (SCM)
  • scanning probe lithography

 

Monolithic silicon AFM probe for contact mode and lateral force mode operation.

The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility.

The AFM holder chip fits most commercial AFM systems as it is industry standard size.

 


Coating

Electrically conductive coating of 5 nm Chromium and 25 nm Platinum on both sides of the cantilever. This coating also enhances the laser reflectivity of the cantilever.

AFM Tip

SHAPE
Rotated
HEIGHT
17 µm 
(15 - 19 µm)*
SETBACK
15 µm 
(10 - 20 µm)*
RADIUS
< 25 nm
HALF CONE ANGLE
20°-25° along cantilever axis, 25°-30° from side, 10° at the apex

 

 

AFM Cantilever

Cantilever A
 Beam
 0.2 N/m (0.07 - 0.4 N/m)*
 13 kHz (9 - 17 kHz)*
 450 µm (440 - 460 µm)*
 50 µm (45 - 55 µm)*
 2 µm (1 - 3 µm)*
說明 檔案大小 下載
budgetsensors 探針型錄 123KB
型號 概述 詢價數量